DocumentCode
1568656
Title
Automatic Constraint Generation for guided random simulation
Author
Yeh, Hu-Hsi ; Huang, Chung-Yang Ric
Author_Institution
Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear
2010
Firstpage
613
Lastpage
618
Abstract
In this paper, we proposed an automatic target constraint generation (ATCG) technique to automatically generate compact and high-quality constraints for the guided random simulation environment. Our objective is to tackle the biggest bottleneck of the entire constrained random simulation process - the time-consuming and error-prone manual testbench composition process. By taking only the design under verification and simulation coverage as our inputs, our automatic constraint generation technique can successfully generate just a few key constraints while achieving very high simulation coverage. Our experimental results show that the proposed approach can outperform both directed and random simulations in both coverage and simulation runtime for a variety of designs.
Keywords
automatic test pattern generation; constraint handling; electronic design automation; formal verification; simulation; ATCG technique; automatic target constraint generation; error-prone manual testbench composition process; guided random simulation; time-consuming manual testbench composition process; Analytical models; Binary decision diagrams; Computer bugs; Concrete; Engines; Runtime; State-space methods; Test pattern generators; Testing; Writing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (ASP-DAC), 2010 15th Asia and South Pacific
Conference_Location
Taipei
Print_ISBN
978-1-4244-5765-6
Electronic_ISBN
978-1-4244-5767-0
Type
conf
DOI
10.1109/ASPDAC.2010.5419814
Filename
5419814
Link To Document