• DocumentCode
    1568656
  • Title

    Automatic Constraint Generation for guided random simulation

  • Author

    Yeh, Hu-Hsi ; Huang, Chung-Yang Ric

  • Author_Institution
    Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2010
  • Firstpage
    613
  • Lastpage
    618
  • Abstract
    In this paper, we proposed an automatic target constraint generation (ATCG) technique to automatically generate compact and high-quality constraints for the guided random simulation environment. Our objective is to tackle the biggest bottleneck of the entire constrained random simulation process - the time-consuming and error-prone manual testbench composition process. By taking only the design under verification and simulation coverage as our inputs, our automatic constraint generation technique can successfully generate just a few key constraints while achieving very high simulation coverage. Our experimental results show that the proposed approach can outperform both directed and random simulations in both coverage and simulation runtime for a variety of designs.
  • Keywords
    automatic test pattern generation; constraint handling; electronic design automation; formal verification; simulation; ATCG technique; automatic target constraint generation; error-prone manual testbench composition process; guided random simulation; time-consuming manual testbench composition process; Analytical models; Binary decision diagrams; Computer bugs; Concrete; Engines; Runtime; State-space methods; Test pattern generators; Testing; Writing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (ASP-DAC), 2010 15th Asia and South Pacific
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-5765-6
  • Electronic_ISBN
    978-1-4244-5767-0
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2010.5419814
  • Filename
    5419814