DocumentCode
1568851
Title
Is 3D integration an opportunity or just a hype?
Author
Li, Jin-Fu ; Wu, Cheng-Wen
Author_Institution
Dept. of Electr. Eng., Nat. Central Univ., Jhongli, Taiwan
fYear
2010
Firstpage
541
Lastpage
543
Abstract
Three-dimensional (3D) integration using through silicon via (TSV) is an emerging technology for integrated circuit designs. 3D integration technology provides numerous opportunities to designers looking for more cost-effective system chip solutions. In addition to stacking homogeneous memory dies, 3D integration technology supports heterogeneous integration of memories, logic, sensors, etc. It eases the interconnect performance limitation, provides higher functionality, results in small form factor, etc. On the other hand, there are challenges that should be overcome before volume production of TSV-based 3D ICs becomes possible, e.g., technological challenges, yield and test challenges, thermal and power challenges, infrastructure challenges, etc.
Keywords
integrated circuit design; three-dimensional integrated circuits; 3D integration; cost-effective system; emerging technology; integrated circuit designs; through silicon via; Integrated circuit interconnections; Integrated circuit synthesis; Integrated circuit technology; Logic; Power system interconnection; Production; Silicon; Stacking; Testing; Through-silicon vias;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (ASP-DAC), 2010 15th Asia and South Pacific
Conference_Location
Taipei
Print_ISBN
978-1-4244-5765-6
Electronic_ISBN
978-1-4244-5767-0
Type
conf
DOI
10.1109/ASPDAC.2010.5419826
Filename
5419826
Link To Document