• DocumentCode
    1568851
  • Title

    Is 3D integration an opportunity or just a hype?

  • Author

    Li, Jin-Fu ; Wu, Cheng-Wen

  • Author_Institution
    Dept. of Electr. Eng., Nat. Central Univ., Jhongli, Taiwan
  • fYear
    2010
  • Firstpage
    541
  • Lastpage
    543
  • Abstract
    Three-dimensional (3D) integration using through silicon via (TSV) is an emerging technology for integrated circuit designs. 3D integration technology provides numerous opportunities to designers looking for more cost-effective system chip solutions. In addition to stacking homogeneous memory dies, 3D integration technology supports heterogeneous integration of memories, logic, sensors, etc. It eases the interconnect performance limitation, provides higher functionality, results in small form factor, etc. On the other hand, there are challenges that should be overcome before volume production of TSV-based 3D ICs becomes possible, e.g., technological challenges, yield and test challenges, thermal and power challenges, infrastructure challenges, etc.
  • Keywords
    integrated circuit design; three-dimensional integrated circuits; 3D integration; cost-effective system; emerging technology; integrated circuit designs; through silicon via; Integrated circuit interconnections; Integrated circuit synthesis; Integrated circuit technology; Logic; Power system interconnection; Production; Silicon; Stacking; Testing; Through-silicon vias;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (ASP-DAC), 2010 15th Asia and South Pacific
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-5765-6
  • Electronic_ISBN
    978-1-4244-5767-0
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2010.5419826
  • Filename
    5419826