DocumentCode
1569184
Title
A novel auto-calibration method of the vector magnetometer
Author
Zhang, Xiaoming ; Gao, Lizhen
Author_Institution
Sch. of Electron. & Comput. Sci. & Technol., North Univ. of China, Taiyuan, China
fYear
2009
Abstract
Many types of magnetometers have been used to measure the magnetic field vector in a wide range of commercial and military applications. Measured value of magnetometer is corrupted by various errors. In general, magnetometer output errors are caused by random instrument noise, constant biases, scale factor deviations, nonorthogonality of the sensor axes. The high accuracy measurement of magnetic field requires calibrating precisely the magnetometer and compensating measured error of magnetic field. In this paper a novel auto-calibration method of the vector magnetometer is presented. The auto-calibration method can be separated into two steps: fitting ellipsoid to the 3D measured data and solving the model parameters of magnetometer from the fitting ellipsoid. According to the model parameters the measured data is corrected to improve the precision of magnetometer. The ellipsoid fitting algorithm and the model parameter solution are all linear to avoid the nonlinear calculation and the complex iteration. To evaluate the performance of the auto-calibration method, the simulation experiments were performed. The results show that the new method is more convenient the conventional methods, and have many advantages such as: quick, stable, high precision and insensitive to small errors in the data.
Keywords
calibration; magnetic field measurement; magnetometers; auto-calibration method; ellipsoid fitting algorithm; magnetic field vector measurement; measured error compensation; scale factor; vector magnetometer; Calibration; Ellipsoids; Instruments; Magnetic field measurement; Magnetic fields; Magnetic noise; Magnetic separation; Magnetometers; Navigation; Parameter estimation; auto-calibration; ellipsoid fitting; magnetometer modeling; vector magnetometer;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-3863-1
Electronic_ISBN
978-1-4244-3864-8
Type
conf
DOI
10.1109/ICEMI.2009.5274904
Filename
5274904
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