• DocumentCode
    1569370
  • Title

    Imaging antiferromagnetic domains at surfaces and interfaces using dichroism XPEEM

  • Author

    Ohldag, H. ; Scholl, A. ; Stohr, J. ; Regan, T.J. ; Weber, N.B. ; Nolting, F. ; White, R.L. ; Hillebrecht, F.U.

  • Author_Institution
    Synchrotron Radiat. Lab., Stanford Univ., CA, USA
  • fYear
    2002
  • Abstract
    Summary form only given. With magnetic storage devices becoming more and more sophistic over the last decade, a drastic increase in storage density was made possible. For example a combination of non-magnetic, ferromagnetic and antiferromagnetic layers is used in today´s highly sensitive hard disk read heads. These are capable of separating and reading the magnetic information stored in up to 100 billion magnetic bits per square inch. While in all these devices the coupling between the antiferromagnet and the ferromagnetic layer plays an important role, our scientific knowledge about their interface is still poor. This is attributed to the lack of experimental methods to characterize the antiferromagnetic structure at surfaces and/or interfaces. Here, the ability of dichroism x-ray absorption spectromicroscopy using a photoemission electron microscope (PEEM) to characterize the antiferromagnetic order of bare surfaces or buried interfaces will be discussed.
  • Keywords
    X-ray absorption spectra; antiferromagnetism; dichroism; interface magnetism; magnetic domains; photoelectron microscopy; surface magnetism; dichroism XPEEM; dichroism x-ray absorption spectromicroscopy; imaging antiferromagnetic domains; interfaces; photoemission electron microscope; surfaces; Antiferromagnetic materials; Electromagnetic wave absorption; Electrons; Light sources; Magnetic domains; Magnetic materials; Magnetic properties; Magnetic separation; Photoelectron microscopy; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
  • Conference_Location
    Amsterdam, The Netherlands
  • Print_ISBN
    0-7803-7365-0
  • Type

    conf

  • DOI
    10.1109/INTMAG.2002.1001116
  • Filename
    1001116