DocumentCode
1569401
Title
High resolution quantitative magnetic force microscopy
Author
Hug, H.J. ; Kappenberger, P. ; Martin, Sebastien ; Reimann, Peter ; Hoffmann, Raik ; Rychen, J. ; Lu, Wenchao ; Guntherodt, H.-J.
Author_Institution
Inst. fur Phys., Basel Univ., Switzerland
fYear
2002
Abstract
Summary form only given. The bit size in magnetic recording has reached the resolution limit of presently available magnetic force microscopes. The next generation of magnetic force microscopes are expected to measure the magnetic field quantitatively, obtain a lateral resolution below 10 nm, and achieve a complete separation between topographical and magnetic information.
Keywords
magnetic field measurement; magnetic force microscopy; 10 nm; lateral resolution; magnetic field; magnetic force microscopy; magnetic imaging; quantitative measurement; topographic imaging; Calibration; Force measurement; Magnetic field measurement; Magnetic force microscopy; Magnetic forces; Magnetic recording; Magnetic separation; Physics; Signal resolution; Surfaces;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location
Amsterdam, The Netherlands
Print_ISBN
0-7803-7365-0
Type
conf
DOI
10.1109/INTMAG.2002.1001119
Filename
1001119
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