Title :
Application of isolated diffraction edge (IDE) method for urban microwave path loss prediction
Author :
Chung, Hyun Kyu ; Bertoni, Henry L.
Author_Institution :
Mobile Telecommun. Res. Laboratory, Electron. & Telecommun. Res. Inst., Daejeon, South Korea
Abstract :
The multiple knife-edge diffraction is a dominant mechanism for path loss prediction in the microwave frequency band, when vertical plane propagation over rooftops is considered in urban/suburban environments. When the number of knife-edges between transmitter and receiver has a large value, path loss prediction suffers from inaccuracy due to the multiple edge diffractions in the transition regions near shadow boundaries. This paper proposes a heuristic method using the isolated diffraction edges (IDE) selection algorithm for path loss prediction when a number of intervening buildings is up to 100 and buildings are modeled as knife-edges with random heights. The prediction results are compared with the theoretical results from two-dimensional physical optics (PO) for multiple forward diffractions. In most cases, the standard deviation of prediction errors is below 4 dB, and overall prediction results agree well with those of PO integrations even though N has a large value up to 100.
Keywords :
electromagnetic wave diffraction; losses; microwave propagation; physical optics; isolated diffraction edge; knife-edge diffraction; multiple edge diffractions; multiple forward diffractions; physical optics; shadow boundaries; transition regions; urban microwave path loss prediction; vertical plane propagation; Image segmentation; Microwave frequencies; Microwave propagation; Microwave theory and techniques; Optical diffraction; Optical losses; Optical transmitters; Physical optics; Predictive models; Propagation losses;
Conference_Titel :
Vehicular Technology Conference, 2003. VTC 2003-Spring. The 57th IEEE Semiannual
Print_ISBN :
0-7803-7757-5
DOI :
10.1109/VETECS.2003.1207531