• DocumentCode
    1569541
  • Title

    Integrated read assist-sense amplifier scheme for high performance embedded SRAMs

  • Author

    Shakir, Tahseen ; Rennie, David ; Sachdev, Manoj

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada
  • fYear
    2010
  • Firstpage
    137
  • Lastpage
    140
  • Abstract
    Embedded memories have become a dominant block in modern SOCs and often constitute more than half the die area. Sense amplifiers are crucial circuits in memories as they are largely responsible for the read operation. The scaling of CMOS technology deep into the sub-micron range has created numerous challenges for SRAMs; notably in that conventional sense amplifier architectures suffer from mismatch and process variability. This paper presents a novel sensing schemes featuring a read assist circuit that enhances the SRAM cell operation and robustness. Schematic and post layout simulation results show a 60% speed improvement and 62% power saving as compared to conventional sensing schemes.
  • Keywords
    CMOS integrated circuits; SRAM chips; circuit simulation; embedded systems; integrated circuit layout; system-on-chip; CMOS technology; SOC; SRAM cell operation; embedded memory; high performance embedded SRAM; integrated read assist-sense amplifier scheme; post layout simulation; process variability; read assist circuit; sense amplifier architectures; sense amplifiers; submicron range; CMOS technology; Circuit simulation; Differential amplifiers; Inverters; Latches; Operational amplifiers; Random access memory; Read-write memory; Robustness; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2010 53rd IEEE International Midwest Symposium on
  • Conference_Location
    Seattle, WA
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-4244-7771-5
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2010.5548581
  • Filename
    5548581