DocumentCode
1569607
Title
Checker-pattern and shared two pixels LOFIC CMOS image sensors
Author
Tashiro, Yoshiaki ; Kawada, Shun ; Sakai, Shin ; Sugawa, Shigetoshi
Author_Institution
Grad. Sch. of Eng., Tohoku Univ., Sendai, Japan
fYear
2010
Firstpage
343
Lastpage
344
Abstract
Two wide dynamic range CMOS image sensors with lateral overflow integration capacitor have been developed. A checker-pattern image sensor has achieved high area efficiency by placing the color filters and on-chip microlens along the direction at an angle of 45°. A shared two pixels image sensor has achieved small pixel pitch by introducing a lateral overflow gate in each pixel. The fabricated image sensors exhibit high full well capacity, low noise, wide dynamic range and high resolution performance.
Keywords
CMOS image sensors; capacitors; microlenses; optical filters; LOFIC CMOS image sensors; checker-pattern image sensor; color filters; lateral overflow integration capacitor; on-chip microlens; CMOS image sensors; Capacitors; Colored noise; Dynamic range; Filters; Image resolution; Image sensors; Lenses; Microoptics; Pixel;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (ASP-DAC), 2010 15th Asia and South Pacific
Conference_Location
Taipei
Print_ISBN
978-1-4244-5765-6
Electronic_ISBN
978-1-4244-5767-0
Type
conf
DOI
10.1109/ASPDAC.2010.5419872
Filename
5419872
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