Title :
TRECO: Dynamic technology remapping for timing Engineering Change Orders
Author :
Ho, Kuan-Hsien ; Jiang, Jie-Hong R. ; Chang, Yao-Wen
Author_Institution :
Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
Due to the increasing IC design complexity, Engineering Change Orders (ECOs) have become a necessary technique to resolve late-found functional and/or timing deficiencies. To fix timing violations, the principles of gate sizing and buffer insertion are commonly used in post-mask ECO. These techniques however may not be powerful enough, especially when spare cells are inserted in a way of striking a balance between functional and timing repair capabilities. We propose a post-mask ECO technique, called TRECO, to remedy timing violations based on technology remapping, which supports functional ECO as well. Unlike conventional technology mapping, TRECO performs technology mapping with respect to a limited set of spare cells and confronts dynamic changes of wiring cost incurred by different spare-cell selections. With a pre-computed lookup table of representative circuit templates, TRECO iteratively performs technology remapping to restructure timing critical sub-circuits until no timing violation remains. Experimental results on five industrial designs show the effectiveness of TRECO in ECO timing optimization.
Keywords :
integrated circuit design; maintenance engineering; IC design; TRECO; buffer insertion; dynamic technology remapping; functional repair capabilities; gate sizing; late-found functional; lookup table; representative circuit templates; spare-cell selections; timing deficiencies; timing engineering change orders; timing repair capabilities; timing violations; Circuits; Cost function; Delay; Design engineering; Design optimization; Power engineering and energy; Routing; Table lookup; Timing; Wiring;
Conference_Titel :
Design Automation Conference (ASP-DAC), 2010 15th Asia and South Pacific
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-5765-6
Electronic_ISBN :
978-1-4244-5767-0
DOI :
10.1109/ASPDAC.2010.5419874