Title :
A method for multiple fault diagnosis in dynamic analogue circuits
Author :
Tadeusiewicz, Michal ; Sidyk, Piotr ; Halgas, Stanislaw
Author_Institution :
Dept. of Electr., Tech. Univ. of Lodz, Lodz
Abstract :
A method for multiple fault diagnosis in linear and nonlinear dynamic analogue circuits is developed in this paper. The method deals with soft faults and enables us to locate (identify) the faulty elements as well as evaluate their values (parameters). It exploits the transient and sensitivity analyses in the time domain and measurements in a test node. The method needs only two accessible test nodes. Two numerical examples illustrate the proposed approach and show its efficiency.
Keywords :
analogue circuits; fault diagnosis; sensitivity analysis; time-domain analysis; transient analysis; dynamic analogue circuits; multiple fault diagnosis; sensitivity analysis; time domain measurement; transient analysis; Analog computers; Circuit faults; Circuit testing; Control engineering; Control engineering computing; Equations; Fault diagnosis; Time measurement; Transient analysis; Voltage measurement;
Conference_Titel :
Circuit Theory and Design, 2007. ECCTD 2007. 18th European Conference on
Conference_Location :
Seville
Print_ISBN :
978-1-4244-1341-6
Electronic_ISBN :
978-1-4244-1342-3
DOI :
10.1109/ECCTD.2007.4529726
