A common-sense based approach to the automated test-point selection in fault diagnosis

The presented work deals with the problem of electronic analog devices testing - the selection of optimal set of measuring points. The paper discusses various optimization techniques in the field of test point selection, known from the literature and gives some new ideas. The proposed modifications and improvements have form of algorithms. The searching procedure is presented on the example of the benchmark circuit. Then the extension of the methodology for complex fault dictionaries is discussed. The implementation in Prolog of the expert system optimizing the test point sets is presented. Results and conclusions summarize the work. The benefits of the approach have been emphasized and further research pointed.