DocumentCode
1569985
Title
Characterization of the effect of small perturbations on the optical modes in high Q microdisk cavities
Author
Eftekhar, Ali Asghar ; Soltani, Mohammad ; Yegnanarayanan, Siva ; Adibi, Ali
Author_Institution
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA
fYear
2008
Firstpage
314
Lastpage
315
Abstract
We have investigated the effect of small perturbations on the optical modes in a silicon microdisk using a NSOM system. The scattering loss and mode coupling due to NSOM tip and cavity interactions are studied.
Keywords
cavity resonators; light scattering; micro-optics; microcavities; optical microscopy; optical resonators; optical waveguides; silicon; NSOM system; Si; cavity interactions; coupled waveguide microdisk cavity structure; high Q microdisk cavity; mode coupling; optical modes; scattering loss; silicon microdisk; Light scattering; Nonlinear optics; Optical coupling; Optical microscopy; Optical scattering; Optical sensors; Optical waveguides; Particle scattering; Rayleigh scattering; Resonance light scattering; (130.3120) Integrated optics devices; (180.4243) Near-field microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
IEEE Lasers and Electro-Optics Society, 2008. LEOS 2008. 21st Annual Meeting of the
Conference_Location
Acapulco
Print_ISBN
978-1-4244-1931-9
Electronic_ISBN
978-1-4244-1932-6
Type
conf
DOI
10.1109/LEOS.2008.4688616
Filename
4688616
Link To Document