Title :
A 85mV 40nW Process-Tolerant Subthreshold 8Ã\x978 FIR Filter in 130nm Technology
Author :
Myeong-Eun Hwang ; Raychowdhury, Arijit ; Kim, Keejong ; Roy, Kaushik
Author_Institution :
Purdue Univ., West Lafayette
Abstract :
Subthreshold operation is limited by low performance and high susceptibility to process variation. We propose variation tolerant ultra-dynamic voltage scaling (UDVS), and as an example we present an 8 times 8 process-tolerant FIR filter, working in both superthreshold and subthreshold regions featuring adaptive beta-ratio modulation and integrated level converters. Measurements show that the filter works at 85 mV consuming 40 nW, and the proposed method can salvage circuits which potentially failed to operate due to variations.
Keywords :
FIR filters; adaptive modulation; convertors; fault tolerance; scaling circuits; adaptive beta-ratio modulation; integrated level converters; power 40 nW; process variation; process-tolerant subthreshold FIR filter operation; size 130 nm; superthreshold regions; variation tolerant ultra-dynamic voltage scaling; voltage 85 mV; Circuit noise; Degradation; Finite impulse response filter; Inverters; MOS devices; Noise robustness; Pins; Throughput; Virtual manufacturing; Voltage control;
Conference_Titel :
VLSI Circuits, 2007 IEEE Symposium on
Conference_Location :
Kyoto
Print_ISBN :
978-4-900784-05-5
Electronic_ISBN :
978-4-900784-05-5
DOI :
10.1109/VLSIC.2007.4342695
