• DocumentCode
    1570719
  • Title

    Analysis of switched-capacitor and switched-current networks with complete settling assumption

  • Author

    Yustin, I. ; Suyama, Ken

  • Author_Institution
    Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
  • Volume
    4
  • fYear
    1996
  • Firstpage
    428
  • Abstract
    We present a formulation for analyzing switched-capacitor and switched-current networks that is based on an assumption that, the network settles completely during each switching interval. A fast transient analysis of non-linear networks can then be performed since the solution at the end of each switching interval can be obtained without numerical integration. Existing transistor device models may be easily incorporated and their second-order effects (except for the incomplete charging effect) on circuit performance may be simulated. In addition, the small-signal parameters for the device models may be easily extracted for different bias points in each switching interval and the frequency response of the linearized network may be obtained
  • Keywords
    circuit analysis computing; frequency response; integrating circuits; nonlinear network analysis; switched capacitor networks; switched current circuits; transient analysis; transient response; charge conservation equations; circuit performance simulation; complete settling assumption; fast transient analysis; frequency response; incomplete charging effect; linearized network; noninverting SI integrator; nonlinear networks; second-order effects; small-signal parameters; switched-capacitor networks; switched-current networks; switching interval; transistor device models; Analytical models; Circuit simulation; Computational modeling; Equations; Kirchhoff´s Law; Laboratories; Microelectronics; Switched capacitor networks; Switching circuits; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1996. ISCAS '96., Connecting the World., 1996 IEEE International Symposium on
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-7803-3073-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.1996.541993
  • Filename
    541993