Title :
Computing parametric yield using adaptive statistical piecewise linear models
Author :
Li, Man ; Milor, Linda
Author_Institution :
Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
Abstract :
An automated algorithm for computing the parametric yield of large analog circuits is presented. It is based on a piecewise linear statistical modeling approach which can adaptively fit the highly nonlinear relations between circuit performance functions and a large numbers of process variables, which traditional polynomial regression approaches cannot handle. Examples indicate the efficiency and accuracy of this approach
Keywords :
analogue integrated circuits; integrated circuit modelling; integrated circuit yield; piecewise-linear techniques; statistical analysis; IC yield; adaptive statistical piecewise linear models; circuit performance functions; large analog circuits; parametric yield; process variables; Analog circuits; Analog computers; Circuit optimization; Circuit simulation; Computational modeling; Educational institutions; Piecewise linear approximation; Piecewise linear techniques; Polynomials; Yield estimation;
Conference_Titel :
Circuits and Systems, 1996. ISCAS '96., Connecting the World., 1996 IEEE International Symposium on
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-3073-0
DOI :
10.1109/ISCAS.1996.542004
