DocumentCode :
1571021
Title :
Contact-based fault injections and power analysis on RFID tags
Author :
Hutter, Michael ; Schmidt, Jörn-Marc ; Plos, Thomas
Author_Institution :
Inst. for Appl. Inf. Process. & Commun. (IAIK), Graz Univ. of Technol., Graz, Austria
fYear :
2009
Firstpage :
409
Lastpage :
412
Abstract :
In the last decade, many articles have been published that demonstrate the susceptibility of cryptographic devices against implementation attacks. Usually, such devices draw their energy from a contact-based power supply. This power-supply connection is often exploited to extract the secret key by applying fault-injection methods and power-analysis attacks. In this article, we present implementation attacks on Radio Frequency Identification (RFID) tags which are usually powered contactlessly by an electromagnetic field. We describe a contact-based measurement setup that allows both injection of faults and measuring of the power consumption of passive RFID tags. Furthermore, we demonstrate the applicability of our setup by providing practical results of attacks on commercially available HF and UHF RFID tags. The results have led us to the conclusion that RFID tags are as susceptible to such attacks as contact-based powered devices. Appropriate countermeasures are needed to thwart these attacks.
Keywords :
UHF devices; failure analysis; radiofrequency identification; UHF RFID tags; contact-based fault-injection methods; contact-based measurement; contact-based power supply; cryptographic devices; electromagnetic field; power analysis; power consumption; radio frequency identification tags; Cryptography; Electromagnetic fields; Electromagnetic measurements; Energy consumption; Passive RFID tags; Power measurement; Power supplies; RFID tags; Radiofrequency identification; UHF measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuit Theory and Design, 2009. ECCTD 2009. European Conference on
Conference_Location :
Antalya
Print_ISBN :
978-1-4244-3896-9
Electronic_ISBN :
978-1-4244-3896-9
Type :
conf
DOI :
10.1109/ECCTD.2009.5275012
Filename :
5275012
Link To Document :
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