DocumentCode :
1571158
Title :
Effect of milling process on the magnetic properties of FIB patterned magnetic nanostructures
Author :
Dan You ; Zhiyong Liu ; Zaibing Guo ; Yuankai Zheng ; Yihong Wu
Author_Institution :
Nano Spin Electron., Data Storage Inst., Singapore, Singapore
fYear :
2002
Abstract :
Summary form only given. There has been much interest in nano-patterning of hard and soft magnetic materials and perpendicular recording media using the FIB technique, but very few of them has been focused on the milling process and its effect on the magnetic properties of the patterned nanostructures. In this work, the FIB patterning of commercial post-sputtering longitudinal media has been performed with emphasis on how the redeposition would affect the morphology of the patterned structure as well as its magnetic properties. The former was studied using AFM and the latter by MFM.
Keywords :
atomic force microscopy; focused ion beam technology; ion-surface impact; machining; magnetic force microscopy; magnetic thin films; nanostructured materials; perpendicular magnetic recording; surface morphology; AFM; FIB patterned magnetic nanostructures; MFM; commercial post-sputtering longitudinal media; magnetic properties; milling process; morphology; Magnetic anisotropy; Magnetic force microscopy; Magnetic hysteresis; Magnetic properties; Magnetization; Milling; Nanostructures; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Soft magnetic materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
Type :
conf
DOI :
10.1109/INTMAG.2002.1001215
Filename :
1001215
Link To Document :
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