Title :
Magnetic properties of magnetic nano-wire arrays
Author :
Han, G.C. ; Zong, B.Y. ; Wu, Y.H.
Author_Institution :
Nano Spinelectronics, Nat. Univ. of Singapore, Singapore
Abstract :
Summary form only given. Arrays of NiFe and CoNiFe nanowires with high aspect ratio (length divided by diameter) of up to 3000 were grown in anodic alumina and track etched polycarbonate membranes with pore sizes ranged from 20 nm to 80 nm by pulsed electrodeposition. Magnetic properties of the array were studied as functions of wire length, interwire distance, pore size and angle between wire axis and applied field through vibrating sample magnetometer (VSM) and torque measurements. X-ray diffraction patterns of the samples shows that the NiFe and CoNiFe are mainly crystallized in the fcc structure with [111] preferred orientation. The wire length and diameter, and interwire distance were examined by scanning electron microscopy. It was found that the magnetic behavior (magnetic anisotropy, coercivity) of the array was strongly dependent of the distance between wires as well as their length and diameter.
Keywords :
X-ray diffraction; arrays; cobalt alloys; coercive force; ferromagnetic materials; iron alloys; magnetic anisotropy; nanowires; nickel alloys; scanning electron microscopy; 20 to 80 nm; Al/sub 2/O/sub 3/; CoNiFe; NiFe; VSM; X-ray diffraction; anodic alumina; coercivity; fcc structure; interwire distance; magnetic anisotropy; magnetic nano-wire arrays; magnetic properties; nanowires; pore size; preferred orientation; pulsed electrodeposition; scanning electron microscopy; torque measurements; track etched polycarbonate membranes; vibrating sample magnetometer; wire length; Biomembranes; Etching; Magnetic anisotropy; Magnetic properties; Magnetometers; Nanowires; Perpendicular magnetic anisotropy; Torque measurement; Wire; X-ray diffraction;
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
DOI :
10.1109/INTMAG.2002.1001219