• DocumentCode
    1571254
  • Title

    Elliptic Metric K-NN Method with Asymptotic MDL Measure

  • Author

    Satonaka, T. ; Uchimura, Keiichi

  • Author_Institution
    Visual Syst. Dept., Kumamoto Prefectual Coll. of Technol., Kikuyou, Japan
  • fYear
    2006
  • Firstpage
    2065
  • Lastpage
    2068
  • Abstract
    We describe an adaptive metric learning model combining the generative and the discriminative models for the face recognition. The asymptotic model based on the MDL measure is formulated for each class to estimate the variance by using small training examples. The feature fusion method is introduced to assume the missing patterns between the classes and to deal with the k-th nearest neighbor classification. The metric parameters obtained from the asymptotic MDL estimation are refined by using the synthesized feature patterns. We demonstrate an improved recognition performance on the ORL and UMIST face databases.
  • Keywords
    face recognition; feature extraction; image classification; image fusion; visual databases; ORL face database; Olivetti Research Laboratory; UMIST face database; adaptive metric learning model; asymptotic MDL estimation; discriminative model; elliptic metric K-NN method; face recognition; feature fusion method; feature pattern synthesis; k-th nearest neighbor classification; maximum description length; Discrete cosine transforms; Educational institutions; Face recognition; Fusion power generation; Linear discriminant analysis; Nearest neighbor searches; Neural networks; Principal component analysis; Spatial databases; Visual system; face; generative; neural; recognition;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 2006 IEEE International Conference on
  • Conference_Location
    Atlanta, GA
  • ISSN
    1522-4880
  • Print_ISBN
    1-4244-0480-0
  • Type

    conf

  • DOI
    10.1109/ICIP.2006.312864
  • Filename
    4106967