Title :
Elliptic Metric K-NN Method with Asymptotic MDL Measure
Author :
Satonaka, T. ; Uchimura, Keiichi
Author_Institution :
Visual Syst. Dept., Kumamoto Prefectual Coll. of Technol., Kikuyou, Japan
Abstract :
We describe an adaptive metric learning model combining the generative and the discriminative models for the face recognition. The asymptotic model based on the MDL measure is formulated for each class to estimate the variance by using small training examples. The feature fusion method is introduced to assume the missing patterns between the classes and to deal with the k-th nearest neighbor classification. The metric parameters obtained from the asymptotic MDL estimation are refined by using the synthesized feature patterns. We demonstrate an improved recognition performance on the ORL and UMIST face databases.
Keywords :
face recognition; feature extraction; image classification; image fusion; visual databases; ORL face database; Olivetti Research Laboratory; UMIST face database; adaptive metric learning model; asymptotic MDL estimation; discriminative model; elliptic metric K-NN method; face recognition; feature fusion method; feature pattern synthesis; k-th nearest neighbor classification; maximum description length; Discrete cosine transforms; Educational institutions; Face recognition; Fusion power generation; Linear discriminant analysis; Nearest neighbor searches; Neural networks; Principal component analysis; Spatial databases; Visual system; face; generative; neural; recognition;
Conference_Titel :
Image Processing, 2006 IEEE International Conference on
Conference_Location :
Atlanta, GA
Print_ISBN :
1-4244-0480-0
DOI :
10.1109/ICIP.2006.312864