DocumentCode :
1571263
Title :
High density patterned quantum dot arrays fabricated by electron beam lithography and wet chemical etching
Author :
Verma, V.B. ; Coleman, J.J.
Author_Institution :
Dept. of Electr. & Comput. Eng, Univ. of Illinois at Urbana-Champaign, Wright, FL
fYear :
2008
Firstpage :
431
Lastpage :
432
Abstract :
The self-assembly method of forming QDs, although well established as a reliable growth technique, does not allow explicit control over the size and position of each QD. The large size variation of these QDs typically results in significant inhomogeneous broadening, diminishing the potential advantages of their use in optoelectronic devices such as low threshold current density, narrow gain bandwidth, and increased characteristic temperature [1]. Furthermore, the ability to control both the position and spectral properties of a single QD is of great importance for the next generation of nanophotonic devices integrating photonic crystal nanocavities with single QD emitters, which have potential applications in quantum optics and cavity quantum electrodynamics.
Keywords :
electron beam lithography; etching; integrated optics; nanopatterning; nanophotonics; optoelectronic devices; quantum dots; quantum electrodynamics; quantum optics; cavity quantum electrodynamics; electron beam lithography; high density patterned quantum dot array; nanophotonic device; photonic crystal nanocavity; quantum optics; wet chemical etching; Chemicals; Electron beams; Lithography; Nanoscale devices; Optoelectronic devices; Quantum dots; Self-assembly; Size control; Temperature control; Wet etching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IEEE Lasers and Electro-Optics Society, 2008. LEOS 2008. 21st Annual Meeting of the
Conference_Location :
Acapulco
Print_ISBN :
978-1-4244-1931-9
Electronic_ISBN :
978-1-4244-1932-6
Type :
conf
DOI :
10.1109/LEOS.2008.4688675
Filename :
4688675
Link To Document :
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