DocumentCode :
1571283
Title :
High speed, error corrected, vector S-parameter measurements
Author :
Caldwell, O.M. ; Huff, J.D.
Author_Institution :
Sci. Atlanta Inc., GA, USA
fYear :
1991
Firstpage :
27
Lastpage :
34
Abstract :
Techniques are presented that have been successfully utilized in a high-speed vector network analyzer to reduce multistate device test times without reducing measurement confidence or accuracy compared to conventional network analyzers. The technique utilizes conventional S-parameter measurement practices applied in an integrated instrumentation and computer environment. This integrated test station architecture has been realized in the Scientific-Atlanta Model 2096 and is used as the example
Keywords :
S-parameters; automatic test equipment; computer architecture; microwave measurement; network analysers; Scientific-Atlanta Model 2096; high-speed vector network analyzer; integrated instrumentation and computer environment; integrated test station architecture; multistate device test times; vector S-parameter measurements; Circuits; Current measurement; Error correction; Frequency; Impedance; Instruments; Scattering parameters; Vectors; Velocity measurement; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1991. IMTC-91. Conference Record., 8th IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
0-87942-579-2
Type :
conf
DOI :
10.1109/IMTC.1991.161533
Filename :
161533
Link To Document :
بازگشت