DocumentCode :
1571547
Title :
Leakage power considerations in actively running blocks
Author :
El-Dib, Dalia A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Victoria, Victoria, BC, Canada
fYear :
2010
Firstpage :
805
Lastpage :
808
Abstract :
Leakage power reductions in active circuits have attracted researcher´s attention for the last few years because of expectations of higher share of leakage power in total power consumption for downsized technologies. It was expected that leakage power will even overcome dynamic power consumption in submicron technologies. However, large portions of the research conducted for actively running processors has overseen two important factors of the design, the frequency of operation and the activity rate. It is shown that these must be investigated before starting to worry about leakage in actively running blocks. In fact, leakage energy constitutes less than 1% of total energy consumption in actively running parts.
Keywords :
leakage currents; power consumption; downsized technology; dynamic power consumption; leakage power consideration; leakage power reduction; submicron technology; Active circuits; Adders; Batteries; Birth disorders; CMOS technology; Circuit faults; Cost function; Dynamic range; Energy consumption; Frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (MWSCAS), 2010 53rd IEEE International Midwest Symposium on
Conference_Location :
Seattle, WA
ISSN :
1548-3746
Print_ISBN :
978-1-4244-7771-5
Type :
conf
DOI :
10.1109/MWSCAS.2010.5548691
Filename :
5548691
Link To Document :
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