• DocumentCode
    1571547
  • Title

    Leakage power considerations in actively running blocks

  • Author

    El-Dib, Dalia A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Victoria, Victoria, BC, Canada
  • fYear
    2010
  • Firstpage
    805
  • Lastpage
    808
  • Abstract
    Leakage power reductions in active circuits have attracted researcher´s attention for the last few years because of expectations of higher share of leakage power in total power consumption for downsized technologies. It was expected that leakage power will even overcome dynamic power consumption in submicron technologies. However, large portions of the research conducted for actively running processors has overseen two important factors of the design, the frequency of operation and the activity rate. It is shown that these must be investigated before starting to worry about leakage in actively running blocks. In fact, leakage energy constitutes less than 1% of total energy consumption in actively running parts.
  • Keywords
    leakage currents; power consumption; downsized technology; dynamic power consumption; leakage power consideration; leakage power reduction; submicron technology; Active circuits; Adders; Batteries; Birth disorders; CMOS technology; Circuit faults; Cost function; Dynamic range; Energy consumption; Frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2010 53rd IEEE International Midwest Symposium on
  • Conference_Location
    Seattle, WA
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-4244-7771-5
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2010.5548691
  • Filename
    5548691