Title :
Machine Learning Approach for Ontology Mapping Using Multiple Concept Similarity Measures
Author_Institution :
Principles of Inf. Res. Div., Nat. Inst. of Inf., Tokyo
Abstract :
This paper presents a new framework for the ontology mapping problem. We organized the ontology mapping problem into a standard machine learning framework, which uses multiple concept similarity measures. We presented several concept similarity measures for the machine learning framework and conducted experiments for testing the framework using real-world data. Our experimental results show that our approach has increased performance with respect to precision, recall and F-measure in comparison with other methods.
Keywords :
learning (artificial intelligence); ontologies (artificial intelligence); F-measure; machine learning approach; multiple concept similarity measures; ontology mapping; precision; recall; Decision making; Informatics; Information science; Internet; Joining processes; Machine learning; Measurement standards; Ontologies; Semantic Web; Testing; machine learning; ontology mapping; semantic integration; semantic web;
Conference_Titel :
Computer and Information Science, 2008. ICIS 08. Seventh IEEE/ACIS International Conference on
Conference_Location :
Portland, OR
Print_ISBN :
978-0-7695-3131-1
DOI :
10.1109/ICIS.2008.51