• DocumentCode
    1572038
  • Title

    Machine Learning Approach for Ontology Mapping Using Multiple Concept Similarity Measures

  • Author

    Ichise, Ryutaro

  • Author_Institution
    Principles of Inf. Res. Div., Nat. Inst. of Inf., Tokyo
  • fYear
    2008
  • Firstpage
    340
  • Lastpage
    346
  • Abstract
    This paper presents a new framework for the ontology mapping problem. We organized the ontology mapping problem into a standard machine learning framework, which uses multiple concept similarity measures. We presented several concept similarity measures for the machine learning framework and conducted experiments for testing the framework using real-world data. Our experimental results show that our approach has increased performance with respect to precision, recall and F-measure in comparison with other methods.
  • Keywords
    learning (artificial intelligence); ontologies (artificial intelligence); F-measure; machine learning approach; multiple concept similarity measures; ontology mapping; precision; recall; Decision making; Informatics; Information science; Internet; Joining processes; Machine learning; Measurement standards; Ontologies; Semantic Web; Testing; machine learning; ontology mapping; semantic integration; semantic web;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer and Information Science, 2008. ICIS 08. Seventh IEEE/ACIS International Conference on
  • Conference_Location
    Portland, OR
  • Print_ISBN
    978-0-7695-3131-1
  • Type

    conf

  • DOI
    10.1109/ICIS.2008.51
  • Filename
    4529843