DocumentCode
1572038
Title
Machine Learning Approach for Ontology Mapping Using Multiple Concept Similarity Measures
Author
Ichise, Ryutaro
Author_Institution
Principles of Inf. Res. Div., Nat. Inst. of Inf., Tokyo
fYear
2008
Firstpage
340
Lastpage
346
Abstract
This paper presents a new framework for the ontology mapping problem. We organized the ontology mapping problem into a standard machine learning framework, which uses multiple concept similarity measures. We presented several concept similarity measures for the machine learning framework and conducted experiments for testing the framework using real-world data. Our experimental results show that our approach has increased performance with respect to precision, recall and F-measure in comparison with other methods.
Keywords
learning (artificial intelligence); ontologies (artificial intelligence); F-measure; machine learning approach; multiple concept similarity measures; ontology mapping; precision; recall; Decision making; Informatics; Information science; Internet; Joining processes; Machine learning; Measurement standards; Ontologies; Semantic Web; Testing; machine learning; ontology mapping; semantic integration; semantic web;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer and Information Science, 2008. ICIS 08. Seventh IEEE/ACIS International Conference on
Conference_Location
Portland, OR
Print_ISBN
978-0-7695-3131-1
Type
conf
DOI
10.1109/ICIS.2008.51
Filename
4529843
Link To Document