• DocumentCode
    1572509
  • Title

    Emission characteristics of InGaAs/GaAs quantum dot microtube ring resonators

  • Author

    Sahmuganathan, V. ; Mi, Z. ; Drouin, D.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, QC
  • fYear
    2008
  • Firstpage
    553
  • Lastpage
    554
  • Abstract
    In this paper, we have performed a detailed investigation of the cathodoluminescence characteristics of InGaAs/GaAs QD microtube ring resonators fabricated by a single-step lithography process. We have unambiguously demonstrated that self-organized QD layers embedded in rolled-up microtube structures can exhibit significantly improved luminescence efficiency, compared to the as-grown layers. In addition, we have observed, for the first time, optical modes in rolled-up microtubes with an average wall thickness of 75 nm that is significantly smaller than the light wavelength (~ 1.0 mum). The results agree well with detailed analysis using finite-difference time-domain methods.
  • Keywords
    III-V semiconductors; cathodoluminescence; finite difference time-domain analysis; gallium arsenide; indium compounds; resonators; semiconductor quantum dots; InGaAs-GaAs; as-grown layers; cathodoluminescence characteristics; emission characteristics; finite-difference time-domain methods; luminescence efficiency; optical modes; quantum dot microtube ring resonators; rolled-up microtube structures; self-organized QD layers; single-step lithography process; Etching; Gallium arsenide; Indium gallium arsenide; Optical buffering; Optical films; Optical pumping; Optical ring resonators; Q factor; Quantum dots; Resonance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IEEE Lasers and Electro-Optics Society, 2008. LEOS 2008. 21st Annual Meeting of the
  • Conference_Location
    Acapulco
  • Print_ISBN
    978-1-4244-1931-9
  • Electronic_ISBN
    978-1-4244-1932-6
  • Type

    conf

  • DOI
    10.1109/LEOS.2008.4688737
  • Filename
    4688737