DocumentCode :
1572581
Title :
Reliability of Power Electronics Under Thermal Loading
Author :
McCluskey, Patrick
Author_Institution :
Univ. of Maryland, College Park, MD, USA
fYear :
2012
Firstpage :
1
Lastpage :
8
Abstract :
Power electronics have replaced many traditional ways to control the generation, distribution, storage, and use of energy resulting in great improvements in efficiency. The widespread use of power electronics has made it critical that their reliability be characterized and enhanced. This paper will discuss the dominant failure mechanisms in power electronic components, including the power module, capacitors, and boards. Specific focus will be placed on the power module interconnects including wirebonds, planar interconnect, die attach, and substrates, and the reliability concerns associated with increased power levels, increased power density, and higher junction temperatures. Ways of improving reliability through packaging design will be presented.
Keywords :
capacitors; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; lead bonding; power electronics; board; capacitor; die attach; failure mechanism; junction temperature; packaging design; planar interconnect; power density; power electronic component; power level; power module interconnects; reliability; substrate; thermal loading; wirebond; Copper; Microassembly; Power electronics; Reliability; Stress; Substrates; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Power Electronics Systems (CIPS), 2012 7th International Conference on
Conference_Location :
Nuremberg
Print_ISBN :
978-3-8007-3414-6
Type :
conf
Filename :
6170625
Link To Document :
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