• DocumentCode
    1572658
  • Title

    Measurements of the complex refractive index of Pd and Pt films in air and upon adsorption of H2 gas

  • Author

    Goddard, Lynford ; Yeen Wong, Kai ; Garg, Akash ; Behymer, Elaine ; Cole, Garrett ; Bond, Tiziana

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL
  • fYear
    2008
  • Firstpage
    569
  • Lastpage
    570
  • Abstract
    We present complex refractive index measurements of Pd and Pt films from 700-1700 nm using variable angle spectroscopic ellipsometry. Refractive index changes upon H2 gas adsorption were determined by measuring normal incidence reflection and transmission.
  • Keywords
    adsorption; ellipsometry; extinction coefficients; gas sensors; hydrogen; infrared spectra; metallic thin films; palladium; platinum; reflectivity; refractive index; H2; Pd; Pt; complex refractive index measurements; extinction coefficient; gas adsorption; gas sensors; palladium thin film; platinum thin film; variable angle spectroscopic ellipsometry; wavelength 700 nm to 1700 nm; Ellipsometry; Gas detectors; Glass; Hydrogen; Optical films; Optical reflection; Optical refraction; Optical sensors; Optical variables control; Refractive index;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IEEE Lasers and Electro-Optics Society, 2008. LEOS 2008. 21st Annual Meeting of the
  • Conference_Location
    Acapulco
  • Print_ISBN
    978-1-4244-1931-9
  • Electronic_ISBN
    978-1-4244-1932-6
  • Type

    conf

  • DOI
    10.1109/LEOS.2008.4688745
  • Filename
    4688745