DocumentCode
1572658
Title
Measurements of the complex refractive index of Pd and Pt films in air and upon adsorption of H2 gas
Author
Goddard, Lynford ; Yeen Wong, Kai ; Garg, Akash ; Behymer, Elaine ; Cole, Garrett ; Bond, Tiziana
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL
fYear
2008
Firstpage
569
Lastpage
570
Abstract
We present complex refractive index measurements of Pd and Pt films from 700-1700 nm using variable angle spectroscopic ellipsometry. Refractive index changes upon H2 gas adsorption were determined by measuring normal incidence reflection and transmission.
Keywords
adsorption; ellipsometry; extinction coefficients; gas sensors; hydrogen; infrared spectra; metallic thin films; palladium; platinum; reflectivity; refractive index; H2; Pd; Pt; complex refractive index measurements; extinction coefficient; gas adsorption; gas sensors; palladium thin film; platinum thin film; variable angle spectroscopic ellipsometry; wavelength 700 nm to 1700 nm; Ellipsometry; Gas detectors; Glass; Hydrogen; Optical films; Optical reflection; Optical refraction; Optical sensors; Optical variables control; Refractive index;
fLanguage
English
Publisher
ieee
Conference_Titel
IEEE Lasers and Electro-Optics Society, 2008. LEOS 2008. 21st Annual Meeting of the
Conference_Location
Acapulco
Print_ISBN
978-1-4244-1931-9
Electronic_ISBN
978-1-4244-1932-6
Type
conf
DOI
10.1109/LEOS.2008.4688745
Filename
4688745
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