DocumentCode :
1572719
Title :
Specification coverage aided test selection
Author :
Pyhälä, Tuomo ; Heljanko, Keijo
Author_Institution :
Lab. for Theor. Comput. Sci., Helsinki Univ. of Technol., Finland
fYear :
2003
Firstpage :
187
Lastpage :
195
Abstract :
Here, we consider test selection strategies in formal conformance testing. As the testing conformance relation we use the ioco relation, and extend the previously presented on-the-fly test generation algorithms for ioco to include test selection heuristic based on a specification coverage metric. The proposed method combines a greedy test selection with randomization to guarantee completeness. As a novel implementation technique we employ bounded model checking for lookahead in greedy test selection.
Keywords :
Petri nets; conformance testing; formal specification; formal verification; randomised algorithms; software metrics; bounded model checking; formal conformance testing; greedy test selection algorithm; ioco conformance testing relation; on-the-fly test generation algorithm; randomization; specification coverage metric; test selection strategy; Computer bugs; Computer science; Data communication; Event detection; Greedy algorithms; Java; Laboratories; Protocols; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Application of Concurrency to System Design, 2003. Proceedings. Third International Conference on
Print_ISBN :
0-7695-1887-7
Type :
conf
DOI :
10.1109/CSD.2003.1207713
Filename :
1207713
Link To Document :
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