• DocumentCode
    1572830
  • Title

    Laboratory Line Impedance Stabilisation Network: Experimental studies

  • Author

    Ales, A. ; Belkacem, F. Tahar ; Moussaoui, D.

  • Author_Institution
    Electromagn. Syst. Lab., Polytech. Mil. Sch., Algiers, Algeria
  • fYear
    2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper we have completed experimental studies about a measurement device of electromagnetic conducted noise emission generated by Power Electronics (converters). This equipment, manufactured in Electromagnetic Systems Laboratory (ESL) of EMP, is called a Line Impedance Stabilization Network (LISN). Firstly, a presentation of the two topologies: mono and double cells are highlighted. Afterwards, we have experienced its performances by experimental test benches. The performance tests concern the Voltage Drop (VD) caused between the inputs and outputs LISN, on the other hand, they concern as well a Fidelity Test (FT) operated on this equipment. Once the LISN has been manufactured in laboratory, we have tested its output impedance (characteristic impedance) which has to be constant (50 Ω) around frequency range (150 kHz-30 MHz) limited by CISPR regulations.
  • Keywords
    electric potential; electromagnetic interference; power apparatus; power convertors; CISPR regulations; conducted electromagnetic interference test; electromagnetic conducted noise emission; electromagnetic system laboratory; fidelity test; frequency 150 kHz to 30 MHz; laboratory line impedance stabilisation network; power converters; power electronics; resistance 50 ohm; voltage drop; Electromagnetic interference; Impedance; Laboratories; Noise; Power supplies; Topology; Voltage measurement; Common mode; Conducted noise emission; Differential mode; EMC; LISN;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Environment and Electrical Engineering (EEEIC), 2011 10th International Conference on
  • Conference_Location
    Rome
  • Print_ISBN
    978-1-4244-8779-0
  • Type

    conf

  • DOI
    10.1109/EEEIC.2011.5874774
  • Filename
    5874774