DocumentCode :
1572834
Title :
Measurement of out-of-plane demagnetization in thin film media
Author :
Bissell, Philip R. ; Cookson, R.D. ; Vopsaroiu, M. ; Stancu, Alexandru ; Spinu, Leonard
Author_Institution :
Centre for Mater. Sci., Univ. of Central Lancashire, Preston, UK
fYear :
2002
Abstract :
Summary form only given. A method has been developed to measure the thickness of a magnetic coating on a particulate tape. This involves a determination of the demagnetizing field for the film by one of three methods including (1) transverse ac susceptibility (/spl chi//sub t/), (2) switching field measurement perpendicular to the applied field direction after the technique of Flanders and Shtrikman (1962) and (3) in-plane and out-of-plane hysteresis loop closure. The question arises as to the applicability of these measurements to thin film media. In fact, although the same principles apply, only the second method will give a satisfactory result. In case (1), transverse susceptibility measurement for commercial cobalt based sputtered films show virtually no reversible peaks. This is because the general expression for the transverse susceptibility contains a term dependent on k/sub 2/ = K/sub 2//K/sub 1/ and the orientation of grains. Since k/sub 2/ = 0.279 for cobalt, the grain orientation in a sputtered disk will cause a broadening of the transverse susceptibility peak to such an extent that it is immeasurable. This paper will further demonstrate the inapplicability of methods (1) and (3) for thin films and show a series of measurements using method (2) on a number of commercial disks to demonstrate its applicability.
Keywords :
demagnetisation; magnetic recording; magnetic thin films; magnetic variables measurement; thickness measurement; grain orientation; hysteresis loop closure; magnetic coating thickness measurement; out-of-plane demagnetization; sputtered disk; switching field measurement; thin film media; transverse ac susceptibility; Coatings; Cobalt; Demagnetization; Magnetic field measurement; Magnetic films; Magnetic hysteresis; Particle measurements; Sputtering; Thickness measurement; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
Type :
conf
DOI :
10.1109/INTMAG.2002.1001301
Filename :
1001301
Link To Document :
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