Title :
Sixth Annual IEEE International ASIC Conference and Exhibit
Abstract :
The following topics are dealt with: analog and mixed signals; design for test; physical layout; digital signal processing applications; advanced topics in test; architecture and applications; data processing devices and applications; hardware-description-language-based methodology; design and education; application-specific integrated circuit manufacturability and cell library management; field programmable gate arrays; telecommunications; high-level synthesis; interface buffers for mixed voltage and high-performance drivers; integrated circuits for optical communications; modeling and simulation; computer-aided design for packaging; neural network; and image coding
Keywords :
analogue processing circuits; application specific integrated circuits; buffer circuits; circuit CAD; design for testability; driver circuits; hardware description languages; high level synthesis; image coding; integrated circuit design; integrated circuit layout; integrated circuit testing; integrated optoelectronics; mixed analogue-digital integrated circuits; neural nets; packaging; ASIC; OEIC; advanced topics in test; analog signals; architecture; cell library management; computer-aided design; data processing devices; design and education; design for test; digital signal processing applications; field programmable gate arrays; hardware-description-language-based methodology; high-level synthesis; high-performance drivers; image coding; interface buffers; manufacturability; mixed signals; mixed voltage drivers; modeling; neural network; optical communications; packaging; physical layout; simulation; telecommunications;
Conference_Titel :
ASIC Conference and Exhibit, 1993. Proceedings., Sixth Annual IEEE International
Conference_Location :
Rochester, NY, USA
Print_ISBN :
0-7803-1375-5
DOI :
10.1109/ASIC.1993.410705
