DocumentCode :
1573185
Title :
Alternative lead free die attach for power module packaging
Author :
Morelle, Jean Michel ; Tan, Ky Lim ; Vivet, Laurent ; Leon, Renan ; Lavrentieff, Serge
Author_Institution :
Valeo GEEDS, Creteil, France
fYear :
2012
Firstpage :
1
Lastpage :
7
Abstract :
The next review of exemption 8(e) about lead in high melting temperature type solders (i.e. lead based alloys containing 85% by weight or more lead) will be take place in 2014. An alternative to lead base alloy has to be defined before this dead line in order to comply with lead free regulation for automotive high power electronics. Lead free soldering is known to generate more voids than the current high lead content solder. Therefore, new processes, such as vacuum or forming gas reflow soldering, have been investigated in order to reduce the void within the solder joint and to improve the packaging reliability. First, this paper focuses on the lead free die attachment process optimization by using a die laser soldering technology, second on the reliability evaluation of the different test samples, and third onto a reliability simulation procedure for characterizing future assemblies. Several commercial lead free alloys have been evaluated throughout Design of Experiments considering the following quality criteria: porosity rating of the solder joints, thermal shock and power cycling tests withstanding. An acceptable lead-free solder solution is proposed for highly constrained power application. It satisfies both process requirements and reliability objectives compared to standard high lead solders.
Keywords :
automotive electronics; circuit reliability; design of experiments; electronics packaging; power electronics; soldering; automotive high power electronics; design of experiments; die laser soldering; forming gas reflow soldering; high melting temperature type solders; lead based alloys; lead free die attachment process optimization; lead free soldering; packaging reliability; porosity rating; power cycling tests; power module packaging; reliability evaluation; reliability simulation procedure; solder joints; thermal shock; vacuum soldering; Environmentally friendly manufacturing techniques; Lead; Materials; Reliability; Soldering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Power Electronics Systems (CIPS), 2012 7th International Conference on
Conference_Location :
Nuremberg
Print_ISBN :
978-3-8007-3414-6
Type :
conf
Filename :
6170649
Link To Document :
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