• DocumentCode
    1573196
  • Title

    Effects of very thin carbon layer on formation of hcp phase for CoCrPtB perpendicular media with Co/sub 60/Cr/sub 40/ intermediate layer

  • Author

    Saito, Sakuyoshi ; Hoshi, F. ; Takahashi, Masaharu

  • Author_Institution
    Dept. of Electron. Eng., Tohoku Univ., Sendai, Japan
  • fYear
    2002
  • Abstract
    Summary form only given. For CoCr based perpendicular media, many trials have been reported to reduce the initial growth region in magnetic layer by using epitaxial growth technique with a Cr-rich CoCr intermediate layer. Recently it has been reported that CoCr intermediate layer with very thin carbon layer with a thickness less than 1 nm is significantly effective to improve perpendicular magnetic properties for CoCr-based perpendicular recording media. However, the role of very thin carbon layer for the microstructure of the film has not been clarified yet. In this paper, we present the mechanism of film growth of CoCr intermediate layer and CoCrPtB magnetic layer by analyzing the thickness dependence of in-plane XRD profiles and the perpendicular magnetic anisotropy. The media used in the analysis was Co/sub 69/Cr/sub 19/Pt/sub 8/B/sub 4//Co/sub 60/Cr/sub 40//C(1nm)/Ti(25nm) media (d/sub mag/=30nm, H/sub c/=3.5kOe, and S=0.89), compared with the media without C layer.
  • Keywords
    X-ray diffraction; boron alloys; carbon; chromium alloys; cobalt alloys; magnetic epitaxial layers; magnetic multilayers; perpendicular magnetic anisotropy; perpendicular magnetic recording; platinum alloys; sputter deposition; titanium; 1 nm; 25 nm; 30 nm; Co/sub 69/Cr/sub 19/Pt/sub 8/B/sub 4/-Co/sub 60/Cr/sub 40/-C-Ti; Co/sub 69/Cr/sub 19/Pt/sub 8/B/sub 4//Co/sub 60/Cr/sub 40//C/Ti; epitaxial growth technique; film growth; hcp phase; in-plane XRD profiles; perpendicular magnetic anisotropy; perpendicular media; thickness dependence; Chromium; Epitaxial growth; Magnetic analysis; Magnetic anisotropy; Magnetic films; Magnetic properties; Microstructure; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
  • Conference_Location
    Amsterdam, The Netherlands
  • Print_ISBN
    0-7803-7365-0
  • Type

    conf

  • DOI
    10.1109/INTMAG.2002.1001315
  • Filename
    1001315