• DocumentCode
    1573314
  • Title

    (Fe-Co/Si)/sub n/ multilayers with high saturation magnetization for backlayer of perpendicular magnetic recording media

  • Author

    Kong, S.H. ; Okamoto, T. ; Nakagawa, S.

  • Author_Institution
    Dept. of Phys. Electron., Tokyo Inst. of Technol., Japan
  • fYear
    2002
  • Abstract
    Summary form only given. A storage layer with high perpendicular coercivity (H/sub c/spl perp//) is essentially required to achieve high recording density with high bit stability for perpendicular magnetic recording media. A new material with large 4/spl pi/M/sub s/ above 20 kG must be developed for a soft magnetic backlayer (BL) beneath the storage layer as well as a writing head material (T. Osaka et al, 1998) for keeping away deterioration of the writing field gradients by saturation of the BL. In this study, (Fe-Co/Si)/sub n/ multilayers with large 4/spl pi/M/sub s/ as well as low coercivity are introduced. Domain structure and soft magnetic characteristic of (Fe-Co/Si)/sub n/ multilayers (ML) were compared with those of the other BL materials to clarify their suitability for BL in perpendicular recording media.
  • Keywords
    cobalt alloys; coercive force; elemental semiconductors; iron alloys; magnetic domains; magnetic multilayers; perpendicular magnetic recording; silicon; soft magnetic materials; (Fe-Co/Si)/sub n/ multilayers; 20 kG; BL saturation; FeCo-Si; bit stability; domain structure; perpendicular magnetic recording media backlayer; recording density; saturation magnetization; soft magnetic backlayer; soft magnetic characteristic; storage layer perpendicular coercivity; writing field gradients; writing head material; Coercive force; Magnetic heads; Magnetic materials; Magnetic multilayers; Material storage; Perpendicular magnetic recording; Saturation magnetization; Soft magnetic materials; Stability; Writing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
  • Conference_Location
    Amsterdam, The Netherlands
  • Print_ISBN
    0-7803-7365-0
  • Type

    conf

  • DOI
    10.1109/INTMAG.2002.1001322
  • Filename
    1001322