Application of microwave cavity perturbation techniques in conducting polymers

Author

Wang, Z.H. ; Javadi, H.H.S. ; Epstein, A.J.

Author_Institution

Dept. of Phys., Ohio State Univ., Columbus, OH, USA

fYear

1991

Firstpage

79

Lastpage

82

Abstract

Microwave cavity perturbation (MCP) techniques have been widely used to measure the conductivity (σ) and dielectric constant (ε) of many semiconductors and low-dimensional conductors. The authors briefly summarize the principles of MCP techniques and give a few suggestions for data analyses. Then they examine the applications of MCP to the conducting polyaniline hydrochloride and poly(otoluidine) hydrochloride materials

Keywords

conducting polymers; electrical conductivity measurement; microwave measurement; permittivity measurement; conducting polymers; dielectric constant; electrical conductivity measurement; low-dimensional conductors; microwave cavity perturbation; organic compounds; permittivity; poly(otoluidine) hydrochloride; polyaniline hydrochloride; semiconductors; Conducting materials; Conductivity measurement; Data analysis; Dielectric constant; Dielectric materials; Dielectric measurements; Microwave measurements; Microwave theory and techniques; Perturbation methods; Semiconductor materials;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1991. IMTC-91. Conference Record., 8th IEEE

Conference_Location

Atlanta, GA

Print_ISBN

0-87942-579-2

Type

conf

DOI

10.1109/IMTC.1991.161544

Filename

161544