• DocumentCode
    1574509
  • Title

    Single photon emission from site-controlled InGaN quantum dots up to 90 K

  • Author

    Lei Zhang ; Chu-Hsiang Teng ; Hill, Tyler ; Demory, Brandon ; Hui Deng ; Ku, P.C.

  • Author_Institution
    Dept. of Phys., Univ. of Michigan, Ann Arbor, MI, USA
  • fYear
    2013
  • Firstpage
    89
  • Lastpage
    90
  • Abstract
    Semiconductor quantum dots (QDs) have diverse quantum photonic applications [1] due to their atomic-like properties, characterized by discrete, optically active energy states. Most work to date has been based on III-As and III-P materials, which face severe limitations in operating temperature due to their small band offsets and exciton binding energies. On the other hand, QDs have been typically fabricated by the Stranski-Krastanow growth which forms dots at random locations and creates large inhomogeneity in size and spectral distribution, making controlled coupling of QDs with cavities or another QD difficult. Site-controlled InGaN QDs can address both issues. [2] Compared to III-V QDs, InGaN can alleviate the operating temperature limitation thanks to its large exciton binding energy. [3] In this paper, we report single photon emission up to 90 K from site-controlled InGaN QDs, the highest temperature to date for site-controlled QDs to our best knowledge.
  • Keywords
    III-V semiconductors; binding energy; excitons; gallium compounds; indium compounds; semiconductor quantum dots; wide band gap semiconductors; InGaN; Stranski-Krastanow growth; band offsets; diverse quantum photonic applications; exciton binding energies; operating temperature limitation; semiconductor quantum dots; single photon emission; site-controlled InGaN quantum dots; Anisotropic magnetoresistance; Energy states; Excitons; Photonics; Physics; Plasma temperature; Quantum dots;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2013 71st Annual
  • Conference_Location
    Notre Dame, IN
  • ISSN
    1548-3770
  • Print_ISBN
    978-1-4799-0811-0
  • Type

    conf

  • DOI
    10.1109/DRC.2013.6633807
  • Filename
    6633807