• DocumentCode
    1574761
  • Title

    Application of Artificial Neural Network on Relationship Analysis between Wheat Yield and Soil Nutrients

  • Author

    He, Yong ; Zhang, Yun ; Zhang, Shujuan ; Fang, Hui

  • Author_Institution
    Coll. of Biosyst. Eng. & Food Sci., Zhejiang Univ., Hangzhou
  • fYear
    2006
  • Firstpage
    4530
  • Lastpage
    4533
  • Abstract
    As a type of nonlinear dynamic parallelism system, artificial neutral network has a capacity of identifying complex causal relationships between variables, such as those between the winter wheat yield and the soil spatial distribution nutrients, including water content, organic matter, total nitrogen, alkali-hydrolysable nitrogen, rapidly available phosphorus and potassium. By training 50 tested soil samples in the back-propagation neural network of topological structure 6:9:1, the model of analyzing the relation between the crop yield and those 6 soil characteristics was established to validate the remaining 13 samples. The results show that the soil water content and alkali-hydrolysable nitrogen are linear to the crop yield, the total nitrogen, organic matter and rapidly available potassium are respectively multinomial to it and that the rapidly available phosphorous is of the exponential relationship with the crop yield
  • Keywords
    backpropagation; crops; neural nets; nitrogen; phosphorus; potassium; soil; K; N; P; alkali-hydrolysable nitrogen; artificial neural network; backpropagation neural network; complex causal relationships; crop yield; nonlinear dynamic parallelism system; organic matter; phosphorus; potassium; relationship analysis; soil spatial distribution nutrients; total nitrogen; water content; winter wheat yield; Agricultural engineering; Artificial neural networks; Crops; Educational programs; Neural networks; Nitrogen; Nonlinear dynamical systems; Parameter estimation; Predictive models; Soil;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2005. IEEE-EMBS 2005. 27th Annual International Conference of the
  • Conference_Location
    Shanghai
  • Print_ISBN
    0-7803-8741-4
  • Type

    conf

  • DOI
    10.1109/IEMBS.2005.1615476
  • Filename
    1615476