• DocumentCode
    1574800
  • Title

    Bending effect on frequency performance of InAlAs/InGaAs HEMT transferred on flexible substrate

  • Author

    Bollaert, S. ; Shi, Jack ; Wichmann, Nicolas ; Roelens, Yannick

  • Author_Institution
    IEMN, Univ. of Lille, Villeneuve-d´Ascq, France
  • fYear
    2013
  • Firstpage
    111
  • Lastpage
    112
  • Abstract
    100 nm gate length InAlAs/InGaAs high electron mobility transistors (HEMTs) have been transferred onto polyimide flexible substrate. In our previous paper, high frequency capability was demonstrated despite the presence of kink effect. Cutoff frequencies fT and fmax were respectively 120GHz and 280GHz and similar to value obtained on rigid substrate. In this work, we have designed a specific buffer layer in order to reduce the kink effect. Moreover the effect of bendabilty on RFperformance is explored on flexible devices.
  • Keywords
    III-V semiconductors; aluminium compounds; buffer layers; flexible electronics; gallium arsenide; high electron mobility transistors; indium compounds; millimetre wave transistors; InAlAs-InGaAs; InAlAs-InGaAs HEMT; bending effect; buffer layer; flexible devices; frequency 120 GHz; frequency 280 GHz; frequency performance; high electron mobility transistors; kink effect; polyimide flexible substrate; rigid substrate; size 100 nm; Current measurement; Cutoff frequency; Frequency measurement; HEMTs; Indium gallium arsenide; Strain; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2013 71st Annual
  • Conference_Location
    Notre Dame, IN
  • ISSN
    1548-3770
  • Print_ISBN
    978-1-4799-0811-0
  • Type

    conf

  • DOI
    10.1109/DRC.2013.6633818
  • Filename
    6633818