Title :
Control of coercivity and memory effect in magnetic nanowires
Author :
Allwood, D.A. ; Xiong, Guokun ; Atkinson, David ; Cooke, M.D. ; Cowburn, Russell P.
Author_Institution :
Dept. of Phys., Durham Univ., UK
Abstract :
Summary form only given. The study of magnetism reversal and domain wall motion within extended nanostructures such as magnetic nanowires is important for new technological applications, including magnetic sensors, magnetic memory and magnetic logic devices. We present the results of a study into magnetization reversal in L-shaped nanostructures (arms 100 nm /spl times/ 8 /spl mu/m) fabricated by e-beam lithography from a 5 nm thick, thermally evaporated Ni/sub 80/Fe/sub 20/ film. Spatially-resolved magnetooptical Kerr effect (MOKE) magnetometry provided magnetization analysis of these single, continuous structures.
Keywords :
Kerr magneto-optical effect; coercive force; electron beam lithography; ferromagnetic materials; iron alloys; magnetic domain walls; magnetic storage; magnetisation reversal; nanowires; nickel alloys; 100 nm; 5 nm; 8 micron; L-shaped nanostructures; MOKE; Ni/sub 80/Fe/sub 20/; Ni/sub 80/Fe/sub 20/ film; coercivity; domain wall motion; e-beam lithography; extended nanostructures; magnetic logic devices; magnetic memory; magnetic nanowires; magnetic sensors; magnetism reversal; magnetization analysis; magnetization reversal; memory effect; spatially-resolved magnetooptical Kerr effect magnetometry; thermally evaporated film; Coercive force; Logic devices; Magnetic devices; Magnetic domain walls; Magnetic domains; Magnetic memory; Magnetic sensors; Magnetization reversal; Nanostructures; Nanowires;
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
DOI :
10.1109/INTMAG.2002.1001405
