• DocumentCode
    1575358
  • Title

    1000-RF-tag emulation with an 8bit micro processor

  • Author

    Kamiya, Naoyasu ; Mitsugi, Jin ; Sugimoto, Kenichi ; Nakamura, Osamu ; Murai, Jun

  • Author_Institution
    Auto-ID Lab. Japan, Keio Univ., Yokohama, Japan
  • fYear
    2010
  • Firstpage
    350
  • Lastpage
    355
  • Abstract
    UHF band passive RFID is an essential identification technology in pervasive computing world. One of the industrial demands to UHF band passive RFID is fast reading of many RF tags. This is particularly relevant for item-level-tagging of CDs, DVDs, books and consumer electronics. Many high-speed MAC protocols have been proposed thus far. Quantitative evaluation of reading speed, however, is not easy because we need to lay out many RF tags and measure the reading durations usually through interrogator APIs, which differ from interrogator to interrogator. In this paper, the authors propose two efficient multiple RF tag emulation algorithms which leverage the probabilistic nature of MAC protocol. We have implemented the algorithms onto a programmable battery assisted passive tag (BAP), equipped with an 8bit micro processor and evaluated the reading speed of commercial interrogators. It was revealed that the BAP can efficiently emulate the behavior of more than 1000 Gen2 RF tags for the reading speed evaluation with a trivial penalty on accuracy.
  • Keywords
    access protocols; application program interfaces; microprocessor chips; probability; radiofrequency identification; ubiquitous computing; 8bit microprocessor; MAC protocol; RF tag emulation; RFID; interrogator API; item level tagging; pervasive computing; probability; programmable battery assisted passive tag; radiofrequency identification; trivial penalty; Accuracy; Computational modeling; Emulation; Mathematical model; Probabilistic logic; Radio frequency; Radiofrequency identification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications and Information Technologies (ISCIT), 2010 International Symposium on
  • Conference_Location
    Tokyo
  • Print_ISBN
    978-1-4244-7007-5
  • Electronic_ISBN
    978-1-4244-7009-9
  • Type

    conf

  • DOI
    10.1109/ISCIT.2010.5664864
  • Filename
    5664864