Title :
Effect of edge structure on switching of patterned elements
Author :
McVitie, S. ; Herrmann, M. ; Chapman, J.N.
Author_Institution :
Dept. of Phys. & Astron., Glasgow Univ., UK
Abstract :
Summary form only given. The effect of the edge structure on patterned nano-elements is known to have an effect on the switching mechanisms of such thin film elements. In this paper we present results from experimental studies of elements with different edge structures and compare them with simulations performed on a commercial micromagnetics package. Acicular elements with straight and structured edges were fabricated to determine the role of the edges in the switching mechanism. The permalloy (Ni/sub 80/Fe/sub 20/) elements described here had width 250nm, length 2.0/spl mu/m and thickness 30nm. The ends of the elements were tapered to reduce strong demagnetisation effects and suppress domain wall formation. For elements with structured edges both the edge structure height and period were varied.
Keywords :
Permalloy; demagnetisation; digital simulation; ferromagnetic materials; magnetic domain walls; magnetic particles; magnetic switching; magnetic thin films; micromagnetics; nanoparticles; 2.0 micron; 250 nm; 30 nm; Ni/sub 80/Fe/sub 20/; acicular elements; demagnetisation effects; domain wall formation; edge structure; micromagnetics package; patterned elements; patterned nano-elements; permalloy; simulations; straight edges; structured edges; switching; thin film elements; Astronomy; Magnetic domain walls; Magnetic domains; Magnetic field measurement; Magnetic switching; Magnetization reversal; Nanostructures; Physics; Space technology; Wire;
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
DOI :
10.1109/INTMAG.2002.1001406
