• DocumentCode
    1575576
  • Title

    An image synthesis method for eddy current testing based on extraction of defect orientation

  • Author

    Taniguchi, T. ; Nakamura, K. ; Yamada, S. ; Iwahara, M.

  • Author_Institution
    Univ. of Electro-Commun., Chofu, Japan
  • fYear
    2002
  • Abstract
    Summary form only given. Eddy-current testing (ECT) using meander/mesh coil is shown to be useful, but one cannot detect the defect along the scanning direction of the probe by this method. Therefore, measurements both in horizontal and vertical directions are required, which enforces the analysis of two images for one sample. This paper gives a method for the synthesis of those two images into one image without loss of information on defects, based on the extraction technique of signals with specific orientations. Moreover, one can not only select defects within an angular range, but also compensate the angle-dependent characteristics of the measurement system.
  • Keywords
    crystal defects; eddy current testing; image processing; noncrystalline defects; angle-dependent characteristics; defect orientation extraction; eddy current testing; image synthesis method; scanning direction; Amorphous materials; Annealing; Atomic measurements; Crystallization; Eddy current testing; Electrical capacitance tomography; Image analysis; Magnetic properties; Magnetic susceptibility; Physics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
  • Conference_Location
    Amsterdam, The Netherlands
  • Print_ISBN
    0-7803-7365-0
  • Type

    conf

  • DOI
    10.1109/INTMAG.2002.1001414
  • Filename
    1001414