DocumentCode
157558
Title
Clockless Design Performance Monitoring for Nanometer Technologies
Author
Renaudin, Marc ; Buhrig, Aurelien ; Guillemet, Charles ; Wilson, Richard ; Engels, S.
Author_Institution
TIEMPO-SAS, Montbonnot Saint Martin, France
fYear
2014
fDate
12-14 May 2014
Firstpage
108
Lastpage
109
Abstract
This paper introduces a breakthrough in the domain of performance process monitoring that is based on clockless asynchronous circuits. The process monitoring chip was fabricated using 32 nm and 28 nm bulk technologies and enabled relevant process parameters monitoring using an easy-to-use set-up.
Keywords
asynchronous circuits; logic design; process monitoring; bulk technologies; clockless asynchronous circuits; easy-to-use set-up; nanometer technologies; performance process monitoring; process monitoring chip; relevant process parameters monitoring; size 28 nm; size 32 nm; Asynchronous circuits; Clocks; Libraries; Monitoring; Silicon; Solid modeling; Voltage measurement; asynchronous design; clockless design; nanometer technologies; process monitoring;
fLanguage
English
Publisher
ieee
Conference_Titel
Asynchronous Circuits and Systems (ASYNC), 2014 20th IEEE International Symposium on
Conference_Location
Potsdam
ISSN
1522-8681
Type
conf
DOI
10.1109/ASYNC.2014.24
Filename
6835820
Link To Document