• DocumentCode
    1576046
  • Title

    A thin film technology eddy current microsensor

  • Author

    Gatzen, H.H. ; Iswahjudi, H. ; Andreeva, E.

  • Author_Institution
    Inst. for Microtechnol., Hanover Univ., NH, USA
  • fYear
    2002
  • Abstract
    Summary form only given. Eddy current measurement for non-destructive testing excels due to its simplicity and reliability. While originally developed as an inspection technique for detecting large scale defects, there is a growing need to also identify micron scale cracks. This application necessitates smaller sensors with improved resolution and sensitivity. In this paper, the authors present an eddy current microsensor for the detection of surface microcracks in both ferrous and non-ferrous metals.
  • Keywords
    crack detection; eddy current testing; magnetic sensors; magnetic thin film devices; microcracks; microsensors; surface cracks; ferrous metals; inspection technique; micron scale cracks; nondestructive testing; nonferrous metals; surface microcracks; thin film technology eddy current microsensor; Coils; Current measurement; Eddy current testing; Eddy currents; Magnetic field measurement; Magnetic sensors; Microsensors; Nondestructive testing; Surface resistance; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
  • Conference_Location
    Amsterdam, The Netherlands
  • Print_ISBN
    0-7803-7365-0
  • Type

    conf

  • DOI
    10.1109/INTMAG.2002.1001435
  • Filename
    1001435