DocumentCode
1576062
Title
CMOS scaling in the single digit nodes
Author
Guillorn, Michael A. ; Watson, Thomas J.
Author_Institution
Research Center, Yorktown Heights, New York, USA
fYear
2013
Firstpage
201
Lastpage
202
Abstract
Abstract not available at time of publication.
Keywords
Abstracts; CMOS integrated circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference (DRC), 2013 71st Annual
Conference_Location
Notre Dame, IN, USA
ISSN
1548-3770
Print_ISBN
978-1-4799-0811-0
Type
conf
DOI
10.1109/DRC.2013.6633863
Filename
6633863
Link To Document