Title :
CMOS scaling in the single digit nodes
Author :
Guillorn, Michael A. ; Watson, Thomas J.
Author_Institution :
Research Center, Yorktown Heights, New York, USA
Abstract :
Abstract not available at time of publication.
Keywords :
Abstracts; CMOS integrated circuits;
Conference_Titel :
Device Research Conference (DRC), 2013 71st Annual
Conference_Location :
Notre Dame, IN, USA
Print_ISBN :
978-1-4799-0811-0
DOI :
10.1109/DRC.2013.6633863
