DocumentCode :
1576116
Title :
Nanomembrane β-Ga2O3 high-voltage field effect transistors
Author :
Wan Sik Hwang ; Verma, A. ; Protasenko, Vladimir ; Rouvimov, Sergei ; Huili Xing ; Seabaugh, Alan ; Haensch, Wilfried ; Van de Walle, Chris ; Galazka, Z. ; Albrecht, Martin ; Forrnari, Roberto ; Jena, D.
Author_Institution :
Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA
fYear :
2013
Firstpage :
207
Lastpage :
208
Abstract :
There is considerable excitement recently in the field of transparent conducting-oxide-semiconductors due to the successful realization of large-area single crystals of the wide-bandgap semiconductor β-Ga2O3 by bulk growth methods [1]. The availability of bulk β-Ga2O3 crystals led to the rapid demonstration of high-voltage metal-semiconductor field-effect transistors (MESFETs) by controlled Sn-doped epilayers grown by molecular beam epitaxy (MBE) [2]. β-Ga2O3 has an energy bandgap of ~4.9 eV, significantly larger than both GaN and SiC. Coupled with the availability of low-cost bulk crystals, this material is highly attractive for high-voltage switching applications. Here we show preliminary results that show that similar to layered crystals [3] and rather surprisingly, one can peel-off nanoscale layers of β-Ga2O3 from a nominally undoped bulk single-crystal. Conducting channels can then be created electrostatically in these nanomembranes with a back-gate, and the resulting transistors are able to sustain very high voltages and still switch by several orders of magnitude.
Keywords :
Schottky gate field effect transistors; energy gap; gallium compounds; molecular beam epitaxial growth; nanoelectronics; semiconductor epitaxial layers; silicon compounds; tin; wide band gap semiconductors; Ga2O3; GaN; MBE; MESFET; SiC; Sn; Sn-doped epilayers; bulk β-Ga2O3 crystal; bulk growth method; energy band gap; high voltage field effect transistor; high-voltage switching application; large area single crystal; metal-semiconductor field-effect transistor; molecular beam epitaxy; nanomembrane field effect transistor; transparent conducting-oxide-semiconductor; wide bandgap semiconductor; Crystals; Field effect transistors; Logic gates; Optical switches; Photonic band gap;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2013 71st Annual
Conference_Location :
Notre Dame, IN
ISSN :
1548-3770
Print_ISBN :
978-1-4799-0811-0
Type :
conf
DOI :
10.1109/DRC.2013.6633866
Filename :
6633866
Link To Document :
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