DocumentCode :
1576360
Title :
XPS investigation of carbon-doped TiO2 photocatalysts
Author :
Dong, C.X. ; Wang, Y.J.
Author_Institution :
Nanomaterials Laboratory, Beihua University, 3999 Huashan Road, Jilin 132013, China
fYear :
2012
Firstpage :
1
Lastpage :
4
Abstract :
In order to study the process of doping carbon into TiO2 without external carbon precursor, photocatalysts with different amount of doped carbon were prepared by heating the xerogel obtained by simple sol-gel method at different temperatures. After fitting and analyzing the peaks of XPS spectra of N 1s, C 1s, Ti 2p, O 1s, it is found that the variation trend of the amounts of doped carbon with temperature is in consistency with that of CO bond in samples. The amount of doped carbon in the sample calcined at 250 °C is the highest except that in xerogel. The variation of the relative amounts of CO bonds in samples can be well understood with the help of TG-DSC curves. It is inferred that the produced CO during calcination plays a very important role in carbon doping.
Keywords :
TiO2; XPS; doped carbon; photocatalyst; visible light;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
World Automation Congress (WAC), 2012
Conference_Location :
Puerto Vallarta, Mexico
ISSN :
2154-4824
Print_ISBN :
978-1-4673-4497-5
Type :
conf
Filename :
6321142
Link To Document :
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