Heat dissipation and thermometry in nanosystems: When interfaces dominate

Author

Gotsmann, Bernd ; Menges, Fabian ; Karg, Siegfried ; Troncale, Valentina ; Lantz, Mark ; Mensch, Philipp ; Schmid, Heinz ; Das Kanungo, Pratyush ; Drechsler, U. ; Schmidt, Volker ; Tschudy, Meinrad ; Stemmer, Andreas ; Riel, Heike

Author_Institution

IBM Res. - Zurich, Rueschlikon, Switzerland

fYear

2013

Firstpage

231

Lastpage

232

Abstract

The technological need for characterization of scaled nano-devices is not paralleled with the availability of methods to measure heat flux and temperature on small scales. To measure local temperature and conductance variation we therefore focus on developing measurement tools. These are based on (A) scanning a thermometer across the sample surface region of interest, so called scanning thermal microscopy (SThM), (B) measuring thermal properties directly through self-heating, and (C) measuring directly the heat-flux through 1D-structures.

Keywords

cooling; nanoelectronics; temperature measurement; thermometers; 1D-structures; conductance variation measurement; heat dissipation; heat flux; local temperature measurement; measurement tools; nanosystems; scaled nano-devices; scanning thermal microscopy; self-heating; thermal properties; thermometer; thermometry; Electrodes; Heating; Nanoscale devices; Substrates; Temperature; Temperature measurement; Thermal conductivity;

fLanguage

English

Publisher

ieee

Conference_Titel

Device Research Conference (DRC), 2013 71st Annual

Conference_Location

Notre Dame, IN

ISSN

1548-3770

Print_ISBN

978-1-4799-0811-0

Type

conf

DOI

10.1109/DRC.2013.6633878

Filename

6633878