Title :
μC-based signal processing in process monitoring
Author :
Petuelli, G. ; Blum, G. ; Schmitte, F.-J. ; Welkner, K.
Author_Institution :
Dept. of Mech. Eng., Paderborn Univ., Soest, Germany
fDate :
6/21/1905 12:00:00 AM
Abstract :
Since process deterioration in manufacturing generally is caused by different influences, the evaluation of process signals and knowledge based feature extraction have been performed to ensure and maintain product quality at the highest level possible and to prevent machine and workpiece damage
Keywords :
computerised monitoring; feature extraction; machining; multiprocessing systems; process monitoring; quality control; signal processing; μC-based signal processing; fuzzy logic; knowledge based feature extraction; manufacturing; multiprocessor system; process deterioration; process monitoring; process signals; workpiece damage; Coolants; Drilling; Feature extraction; Force measurement; Manufacturing processes; Mass production; Mechanical engineering; Monitoring; Protection; Signal processing;
Conference_Titel :
Africon, 1999 IEEE
Conference_Location :
Cape Town
Print_ISBN :
0-7803-5546-6
DOI :
10.1109/AFRCON.1999.820933
