DocumentCode
1576558
Title
μC-based signal processing in process monitoring
Author
Petuelli, G. ; Blum, G. ; Schmitte, F.-J. ; Welkner, K.
Author_Institution
Dept. of Mech. Eng., Paderborn Univ., Soest, Germany
Volume
1
fYear
1999
fDate
6/21/1905 12:00:00 AM
Firstpage
501
Abstract
Since process deterioration in manufacturing generally is caused by different influences, the evaluation of process signals and knowledge based feature extraction have been performed to ensure and maintain product quality at the highest level possible and to prevent machine and workpiece damage
Keywords
computerised monitoring; feature extraction; machining; multiprocessing systems; process monitoring; quality control; signal processing; μC-based signal processing; fuzzy logic; knowledge based feature extraction; manufacturing; multiprocessor system; process deterioration; process monitoring; process signals; workpiece damage; Coolants; Drilling; Feature extraction; Force measurement; Manufacturing processes; Mass production; Mechanical engineering; Monitoring; Protection; Signal processing;
fLanguage
English
Publisher
ieee
Conference_Titel
Africon, 1999 IEEE
Conference_Location
Cape Town
Print_ISBN
0-7803-5546-6
Type
conf
DOI
10.1109/AFRCON.1999.820933
Filename
820933
Link To Document