Study of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin film using x-ray scattering and x-ray reflectivity

Author

Sun, C.J. ; Chow, G.M. ; Wang, J.P. ; Soo, E.W. ; Je, J.H.

Author_Institution

Dept. of Mater. Sci., Nat. Univ. of Singapore, Singapore

fYear

2002

Abstract

Summary form only given. CoCrPt films with Ti underlayer have been widely investigated as candidate media for perpendicular recording. The growth of Co alloy is interfacially controlled by the Ti underlayer. Although the engineering effects of Ti underlayer with magnetic properties of CoCrPt film are known, a combined understanding of the effects of crystallographic texture and interface roughness of CoCrPt/Ti films on magnetic properties is yet unclear. In this work, Co/sub 74/Cr/sub 16/Pt/sub 10//Ti films were deposited using DC magnetron sputtering and examined by x-ray scattering and x-ray reflectivity.

Keywords

X-ray reflection; X-ray scattering; chromium alloys; cobalt alloys; interface roughness; magnetic thin films; platinum alloys; sputtered coatings; texture; titanium; Co/sub 74/Cr/sub 16/Pt/sub 10/-Ti; CoCrPt/Ti thin film; DC magnetron sputtering; X-ray reflectivity; X-ray scattering; crystallographic texture; interface roughness; magnetic properties; Chromium; Cobalt alloys; Crystallography; Magnetic films; Magnetic properties; Optical films; Perpendicular magnetic recording; Reflectivity; Titanium alloys; X-ray scattering;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International

Conference_Location

Amsterdam, The Netherlands

Print_ISBN

0-7803-7365-0

Type

conf

DOI

10.1109/INTMAG.2002.1001467

Filename

1001467