DocumentCode
1576868
Title
Room-temperature quantum oscillations in Ge junctionless MOSFETs at the scaling limit
Author
Wu, Huwei ; Zhang, J.Y. ; Gu, J.J. ; Dong, Lixin ; Conrad, N.J. ; Ye, Peide D.
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear
2013
Firstpage
1
Lastpage
2
Abstract
Quantum effects play a significant role in the characteristics of nanoscale devices. Observation of quantum phenomena is often limited to low temperature measurements. Shrinking device sizes to the scaling limit of several nanometers can make quantum energy gap overcome thermal broadening, so that quantum characteristics become prominent even at room temperature. In this abstract, by combining the junctionless MOSFET structure and a novel V-groove etch process [1], we demonstrate germanium on insulator (GeOI) junctionless pMOSFETs with ultra-thin channel thickness (Tch) and sub-10nm channel length (Lch). Devices with Lch from 6 to 15 nm show strong quantum oscillations in Ids-Vgs characteristics at room temperature. Control devices, with thicker channels, show large Ion/Ioff ratios of > 105, and high drain currents of 650 mA/mm.
Keywords
MOSFET; elemental semiconductors; etching; germanium; oscillations; semiconductor-insulator boundaries; Ge; V-groove etch process; control devices; drain currents; germanium on insulator junctionless pMOSFET; room-temperature quantum oscillations; scaling limit; size 6 nm to 15 nm; sub-10nm channel length; temperature 293 K to 298 K; ultra-thin channel thickness; Gold; Logic gates; MOSFET; Oscillators; Oxidation; Temperature; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference (DRC), 2013 71st Annual
Conference_Location
Notre Dame, IN
ISSN
1548-3770
Print_ISBN
978-1-4799-0811-0
Type
conf
DOI
10.1109/DRC.2013.6633892
Filename
6633892
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