Title :
Room-temperature quantum oscillations in Ge junctionless MOSFETs at the scaling limit
Author :
Wu, Huwei ; Zhang, J.Y. ; Gu, J.J. ; Dong, Lixin ; Conrad, N.J. ; Ye, Peide D.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
Quantum effects play a significant role in the characteristics of nanoscale devices. Observation of quantum phenomena is often limited to low temperature measurements. Shrinking device sizes to the scaling limit of several nanometers can make quantum energy gap overcome thermal broadening, so that quantum characteristics become prominent even at room temperature. In this abstract, by combining the junctionless MOSFET structure and a novel V-groove etch process [1], we demonstrate germanium on insulator (GeOI) junctionless pMOSFETs with ultra-thin channel thickness (Tch) and sub-10nm channel length (Lch). Devices with Lch from 6 to 15 nm show strong quantum oscillations in Ids-Vgs characteristics at room temperature. Control devices, with thicker channels, show large Ion/Ioff ratios of > 105, and high drain currents of 650 mA/mm.
Keywords :
MOSFET; elemental semiconductors; etching; germanium; oscillations; semiconductor-insulator boundaries; Ge; V-groove etch process; control devices; drain currents; germanium on insulator junctionless pMOSFET; room-temperature quantum oscillations; scaling limit; size 6 nm to 15 nm; sub-10nm channel length; temperature 293 K to 298 K; ultra-thin channel thickness; Gold; Logic gates; MOSFET; Oscillators; Oxidation; Temperature; Temperature measurement;
Conference_Titel :
Device Research Conference (DRC), 2013 71st Annual
Conference_Location :
Notre Dame, IN
Print_ISBN :
978-1-4799-0811-0
DOI :
10.1109/DRC.2013.6633892